Influence of Temperature on Microelectronics and System Reliability : A Physi...
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Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach, Paperback by Lall, Pradeep; Pecht, Michael G.; Hakim, Edward B., ISBN 0367400979, ISBN-13 9780367400972, Like New Used, Free shipping in the USThis book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.
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