Design for Manufacturability and Statistical Design: A Constructive Approach by

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Design for Manufacturability and Statistical Design by Michael Orshansky, Sani Nassif, Duane Boning

Presents a comprehensive overview of methods that need to be mastered in understanding design for manufacturability and statistical design methodologies. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.

FORMAT
Hardcover LANGUAGE
English CONDITION
Brand New Publisher Description

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to

• understanding the causes of variability;
• design of test structures for variability characterization;
• statistically rigorous data analysis;
• techniques of design for manufacturability in lithography and in chemical mechanical polishing;
• statistical simulation, analysis, and optimization techniques for improving parametric yield.

Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be masteredfor state-of-the-art design for manufacturability and statistical design methodologies. It is animportant reference for practitioners and students in the field of computer-aided design of integrated circuits.

Notes

Unified Treatment of Data Collection, Modeling, and Statistical CAD

Covers From Fabrication to Design to CAD

Deals With the Extraction of Fab Information into distrubutions for analysis

Circuit Structures and Techniques to Reduce On-Chip Variability

Using CAD for the Analysis and Optimization of Timing and Power

Back Cover

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis; techniques of design for manufacturability in lithography and in chemical mechanical polishing; statistical simulation, analysis, and optimization techniques for improving parametric yield. Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.

Table of Contents

Sources of Variability.- Front End Variability.- Back End Variability.- Environmental Variability.- Variability Characterization and Analysis.- Test Structures For Variability.- Statistical Foundations Of Data Analysis And Modeling.- Design Techniques for Systematic Manufacturability Problems.- Lithography Enhancement Techniques.- Ensuring Interconnect Planarity.- Statistical Circuit Design.- Statistical Circuit Analysis.- Statistical Static Timing Analysis.- Leakage Variability And Joint Parametric Yield.- Parametric Yield Optimization.- Conclusions.

Long Description

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis; techniques of design for manufacturability in lithography and in chemical mechanical polishing; statistical simulation, analysis, and optimization techniques for improving parametric yield. Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.

Feature

Unified Treatment of Data Collection, Modeling, and Statistical CAD Covers From Fabrication to Design to CAD Deals With the Extraction of Fab Information into distrubutions for analysis Circuit Structures and Techniques to Reduce On-Chip Variability Using CAD for the Analysis and Optimization of Timing and Power

Details ISBN0387309284 Author Duane Boning Short Title DESIGN FOR MANUFACTURABILITY & Language English ISBN-10 0387309284 ISBN-13 9780387309286 Media Book Format Hardcover Imprint Springer-Verlag New York Inc. Subtitle A Constructive Approach Place of Publication New York, NY Country of Publication United States DOI 10.1604/9780387309286 AU Release Date 2007-12-03 NZ Release Date 2007-12-03 US Release Date 2007-12-03 UK Release Date 2007-12-03 Pages 316 Publisher Springer-Verlag New York Inc. Edition Description 2008 ed. Series Integrated Circuits and Systems Year 2007 Edition 2008th Publication Date 2007-12-03 DEWEY 621.3815 Illustrations XIV, 316 p. Audience Undergraduate Country of Origin US Product Class Description Mechanical Engineering Alternative 9780387690117
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